MRI Gradient Subsystem Accelerated Reliability Test Using Nominal Day Usages

Authors

  • Pradeep Kumar Anand, Dong Ryeol Shin, Mudasar Latif Memon, Ranjita Kumari

Abstract

This paper present a state of art to resolve MRI gradient subsystem unreliability by discovering its many failures and predicting its life before product launch by performing system reliability test as per nominal usage scenario, generating data during the test and computational of generated data using Big Data methodology. Using time of flight 3 dimensional (TOF3D) pulse sequence, a method has presented to stress the gradient subsystem to prove its long life (usually 10 years or more) within few months of accelerated reliability test based on hospital usage condition called as “Nominal Usage”. A computational algorithm has developed to calculate the gradient coil vibration energy stress over the 10 years of product life based on “nominal hospital usage condition” and scientifically matched with few months of reliability test by stressing the system using stringent TOF3D pulse sequence technique. We accelerated the test and perform 60 days of the test to prove the gradient coil reliability of 10 years of service life.

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Published

2020-05-18

Issue

Section

Articles