Reliability Analysis of a Newly Proposed two Disjoint Path Multistage Interconnection Networks

Abstract

For parallel computation, various multistage interconnection networks have been discussed in the literature. But these networks always required further improvement in reliability and fault-tolerance. Fault-tolerance of the network can be achieved by increasing the number of disjoint paths as a result reliability of the interconnection networks also improved. In this paper, two new design of two disjoint paths fault tolerance MINs (2DP-FTMIN-1 and 2DP-FTMIN-2) are discussed. These new designs are inspired by the combination of banyan network, Gamma interconnection network and shuffle exchange network. Here reliability, cost and fault-tolerance of these two proposed layouts of MINs are calculated and these designs are compared with other existing MINs of this category.