Application of Embedded Single Chip Microcomputer in Array Belt Scale under Artificial Intelligence Environment
With the continuous iterative development of belt weigher technology, the accuracy of
various electronic belt scales can be greatly improved. In the process of operation, the
belt scale will be affected by various external factors, and also by the belt tension of the
belt scale itself, resulting in measurement error. Based on this, this paper first studies
the array belt scale technology, then analyses the design of the array belt scale based on
embedded single chip microcomputer, and finally gives the practical application of the
array belt scale based on the embedded MCU in the artificial intelligence environment.