Research and Design of Embedded System for Emissivity Measurement

Authors

  • JianDing,JianCheng,ZhenfengXu

Abstract

As an ion generating device, the ion source is widely used in accelerator, space environment and space physics, integrated circuit manufacturing, wafer production, medical and other fields. Emissivity is an important index to indicate the quality of ion source beam. An emittance measurement system for low-energy and high-current ion beams based on the principle of multi-slit single wire measurement was designed and developed. The system includes a step motor, a beam detector (Faraday cup), a weak signal amplifier, isolators and filters, a C8051F500 microcontroller, and a RS-232 interface circuit. Compared with the existing emittance measurement equipment, the system has the advantages of versatility, portability and high cost performance.

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Published

2020-08-01

Issue

Section

Articles